Characterization of Single-Photon Avalanche Diodes in Standard 140-nm SOI CMOS Technology

MJ Lee, P Sun, E Charbon

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of the International Image Sensor Workshop
EditorsP Magnan
Place of Publications.l.
PublisherIISS
Pages1-4
Number of pages4
Publication statusPublished - 2015
EventIISW 2015, Vaals, The Netherlands - s.l.
Duration: 8 Jun 201511 Jun 2015

Publication series

Name
PublisherIISS

Conference

ConferenceIISW 2015, Vaals, The Netherlands
Period8/06/1511/06/15

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