| Original language | English |
|---|---|
| Pages (from-to) | 1711-1718 |
| Number of pages | 8 |
| Journal | Microelectronics Reliability |
| Volume | 52 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 2012 |
Keywords
- CWTS JFIS < 0.75
M Sadeghinia, KMB Jansen, LJ Ernst
Research output: Contribution to journal › Article › Scientific › peer-review
| Original language | English |
|---|---|
| Pages (from-to) | 1711-1718 |
| Number of pages | 8 |
| Journal | Microelectronics Reliability |
| Volume | 52 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 2012 |