Characterization of ultra-shallow gate n-channel JFETs

G Piccolo, LK Vandamme, M Macucci, LK Nanver

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationSAFE 2007 Semiconductor advances for future electornics
Editors s.n.
Place of Publications.l.
PublisherSTW
Pages1-4
Number of pages4
Publication statusPublished - 2007

Publication series

Name
PublisherSTW

Keywords

  • conference contrib. refereed
  • Vakpubl., Overig wet. > 3 pag

Cite this

Piccolo, G., Vandamme, LK., Macucci, M., & Nanver, LK. (2007). Characterization of ultra-shallow gate n-channel JFETs. In s.n. (Ed.), SAFE 2007 Semiconductor advances for future electornics (pp. 1-4). STW.