Characterizing cable flexure effects in S-parameter measurements

FA Mubarak, G Rietveld, D Hoogenboom, M Spirito

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings 82nd ARFTG Microwave Measurement Conference
EditorsP Roblin, P Aaen, R Rojas-Teran
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-7
Number of pages7
ISBN (Print)978-1-4673-4982-6
DOIs
Publication statusPublished - 2013
Event2013 82nd ARFTG, Columbus, OH, USA - Piscataway, NJ, USA
Duration: 18 Nov 201321 Nov 2013

Publication series

Name
PublisherIEEE

Conference

Conference2013 82nd ARFTG, Columbus, OH, USA
Period18/11/1321/11/13

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