Charge deep-level transient spectroscopy study of high-energy-electron-beam-irradiated hydrogenated amorphous silicon

A Klaver, V Nádazdy, M Zeman, RACMM van Swaaij

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Keywords

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@article{0d6aa20507e34fd880353a6bbf62be26,

title = "Charge deep-level transient spectroscopy study of high-energy-electron-beam-irradiated hydrogenated amorphous silicon",

keywords = "academic journal papers, CWTS JFIS >= 2.00",

author = "A Klaver and V N{\'a}dazdy and M Zeman and {van Swaaij}, RACMM",

year = "2006",

language = "Undefined/Unknown",

volume = "89",

pages = "022119--1--3",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Charge deep-level transient spectroscopy study of high-energy-electron-beam-irradiated hydrogenated amorphous silicon

AU - Klaver, A

AU - Nádazdy, V

AU - Zeman, M

AU - van Swaaij, RACMM

PY - 2006

Y1 - 2006

KW - academic journal papers

KW - CWTS JFIS >= 2.00

M3 - Article

SN - 0003-6951

VL - 89

SP - 022119-1-3

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -