Circular analysis based line detection filters for watermark extraction in X-ray images of etching

M van Staalduinen; JCA van der Lubbe; E Backer

Circular analysis based line detection filters for watermark extraction in X-ray images of etching

M van Staalduinen, JCA van der Lubbe, E Backer

Multimedia Computing

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

Original language	Undefined/Unknown
Title of host publication	ASCI 2004; Proceedings of tenth annual conference of the advanced school for computing and imaging
Editors	JJ Wijk, JWJ Heijnsdijk, KG Langendoen, R Veltkamp
Place of Publication	Delft
Publisher	Advanced School for Computing and Imaging
Pages	115-122
Number of pages	8
ISBN (Print)	90-803086-9-2
Publication status	Published - 2004
Event	Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands - Delft Duration: 2 Jun 2004 → 4 Jun 2004

Publication series

Name
Publisher	Advanced School for Computing and Imaging

Conference

Conference	Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands
Period	2/06/04 → 4/06/04

Keywords

Vakpubl., Overig wet. > 3 pag

Cite this

van Staalduinen, M., van der Lubbe, JCA., & Backer, E. (2004). Circular analysis based line detection filters for watermark extraction in X-ray images of etching. In JJ. Wijk, JWJ. Heijnsdijk, KG. Langendoen, & R. Veltkamp (Eds.), ASCI 2004; Proceedings of tenth annual conference of the advanced school for computing and imaging (pp. 115-122). Advanced School for Computing and Imaging.

van Staalduinen, M ; van der Lubbe, JCA ; Backer, E. / Circular analysis based line detection filters for watermark extraction in X-ray images of etching. ASCI 2004; Proceedings of tenth annual conference of the advanced school for computing and imaging. editor / JJ Wijk ; JWJ Heijnsdijk ; KG Langendoen ; R Veltkamp. Delft : Advanced School for Computing and Imaging, 2004. pp. 115-122

@inproceedings{674559073ce8459cb0263c631d0a40d4,

title = "Circular analysis based line detection filters for watermark extraction in X-ray images of etching",

keywords = "Vakpubl., Overig wet. > 3 pag",

author = "{van Staalduinen}, M and {van der Lubbe}, JCA and E Backer",

year = "2004",

language = "Undefined/Unknown",

isbn = "90-803086-9-2",

publisher = "Advanced School for Computing and Imaging",

pages = "115--122",

editor = "JJ Wijk and JWJ Heijnsdijk and KG Langendoen and R Veltkamp",

booktitle = "ASCI 2004; Proceedings of tenth annual conference of the advanced school for computing and imaging",

note = "Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands ; Conference date: 02-06-2004 Through 04-06-2004",

}

van Staalduinen, M, van der Lubbe, JCA & Backer, E 2004, Circular analysis based line detection filters for watermark extraction in X-ray images of etching. in JJ Wijk, JWJ Heijnsdijk, KG Langendoen & R Veltkamp (eds), ASCI 2004; Proceedings of tenth annual conference of the advanced school for computing and imaging. Advanced School for Computing and Imaging, Delft, pp. 115-122, Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands, 2/06/04.

Circular analysis based line detection filters for watermark extraction in X-ray images of etching. / van Staalduinen, M; van der Lubbe, JCA; Backer, E.
ASCI 2004; Proceedings of tenth annual conference of the advanced school for computing and imaging. ed. / JJ Wijk; JWJ Heijnsdijk; KG Langendoen; R Veltkamp. Delft: Advanced School for Computing and Imaging, 2004. p. 115-122.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific

TY - GEN

T1 - Circular analysis based line detection filters for watermark extraction in X-ray images of etching

AU - van Staalduinen, M

AU - van der Lubbe, JCA

AU - Backer, E

PY - 2004

Y1 - 2004

KW - Vakpubl., Overig wet. > 3 pag

M3 - Conference contribution

SN - 90-803086-9-2

SP - 115

EP - 122

BT - ASCI 2004; Proceedings of tenth annual conference of the advanced school for computing and imaging

A2 - Wijk, JJ

A2 - Heijnsdijk, JWJ

A2 - Langendoen, KG

A2 - Veltkamp, R

PB - Advanced School for Computing and Imaging

CY - Delft

T2 - Tenth annual conference of the Advanced School for Computing and Imaging, Ouddorp, The Netherlands

Y2 - 2 June 2004 through 4 June 2004

ER -

van Staalduinen M, van der Lubbe JCA, Backer E. Circular analysis based line detection filters for watermark extraction in X-ray images of etching. In Wijk JJ, Heijnsdijk JWJ, Langendoen KG, Veltkamp R, editors, ASCI 2004; Proceedings of tenth annual conference of the advanced school for computing and imaging. Delft: Advanced School for Computing and Imaging. 2004. p. 115-122