@inproceedings{eb745485a44b4e06ac4404bdf602e685,
title = "Classifiers for Dissimilarity-based pattern recognition.",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "EM Pekalska and RPW Duin",
note = "ISSN: 1051-4651; Barcelona, Spain ; Conference date: 03-09-2000 Through 07-09-2000",
year = "2000",
language = "Undefined/Unknown",
isbn = "0-7695-0750-6",
publisher = "IEEE",
pages = "12--16",
editor = "A Sanfeliu and JJ Villanueva and M Vanrell and R Alquezar and AK Jain and J Kittler",
booktitle = "ICPR15, Proc. 15th Int. Conference on Pattern Recognition",
address = "United States",
}