Classifying CT Image Data Into Material Fractions by a Scale and Rotaion Invariant Edge Model

IWO Serlie, FM Vos, R Truyen, FH Post, LJ van Vliet

Research output: Contribution to journalArticleScientificpeer-review

23 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)2891-2904
Number of pages14
JournalIEEE Transactions on Image Processing
Volume16
Issue number12
Publication statusPublished - 2007

Keywords

  • CWTS JFIS >= 2.00

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