@inproceedings{27f0a14e80e841bbb5bb38d990c42d2b,
title = "CMOS scaling impacts on reliability, what do we understand?",
keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Vakpubl., Overig wet. > 3 pag",
author = "MSK Seyab and NZB Haron and S Hamdioui",
year = "2008",
language = "Undefined/Unknown",
isbn = "978-90-73461-56-7",
publisher = "STW",
pages = "260--266",
editor = "s.n.",
booktitle = "19th Annual Workshop on Circuits, Systems and Signal Processing",
note = "null ; Conference date: 27-11-2008 Through 28-11-2008",
}