CMOS scaling impacts on reliability, what do we understand?

MSK Seyab, NZB Haron, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	19th Annual Workshop on Circuits, Systems and Signal Processing
Editors	s.n.
Place of Publication	eindhoven
Publisher	STW
Pages	260-266
Number of pages	7
ISBN (Print)	978-90-73461-56-7
Publication status	Published - 2008
Event	PRORISC, Veldhoven, The Netherlands - The Netherlands Duration: 27 Nov 2008 → 28 Nov 2008

Name
Publisher	stw

Conference	PRORISC, Veldhoven, The Netherlands
Period	27/11/08 → 28/11/08

Keywords

@inproceedings{27f0a14e80e841bbb5bb38d990c42d2b,

title = "CMOS scaling impacts on reliability, what do we understand?",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Vakpubl., Overig wet. > 3 pag",

author = "MSK Seyab and NZB Haron and S Hamdioui",

year = "2008",

language = "Undefined/Unknown",

isbn = "978-90-73461-56-7",

publisher = "STW",

pages = "260--266",

editor = "s.n.",