Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing

Miao Cai, Daoguo Yang, Jianlin Huang, Maofen Zhang, Xianping Chen, Caihang Liang, Sau Koh, Guoqi Zhang

Research output: Contribution to journalArticleScientificpeer-review

3 Citations (Scopus)
83 Downloads (Pure)

Abstract

The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated degradation testing. A power model is proposed as the statistical model of the color shift (CS) process of LED products. Consequently, a CS mechanism constant is obtained for detecting the consistency of CS mechanisms among various stress-loaded conditions. A statistical procedure with the proposed power model is then derived for the CS paths of LED lamps in step-loaded stress testing. Two types of commercial LED lamps with different capabilities of heat dissipation (CHDs) are investigated. Results show that the color coordinates of lamps are easily modified in various stress-loaded conditions, and different CHDs of lamps may play a crucial role in the various CS processes. Furthermore, the proposed statistic power model is adequate for the CS process of LED lamps. The consistency of CS mechanisms in step-loaded stress testing can also be detected effectively by applying the proposed statistic procedure with the power model. Moreover, the constant assumption in the model is useful for judging the consistency of CS mechanisms under various stress-loaded conditions.

Original languageEnglish
Article number7765031
JournalIEEE Photonics Journal
Volume9
Issue number1
DOIs
Publication statusPublished - 2017

Keywords

  • color shift (CS)
  • degradation mechanism
  • Light-emitting diodes (LEDs)
  • reliability modeling

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