Column-Parallel Circuits with Digital Correlated Multiple Sampling for Low Noise CMOS Imagers

Y Chen, Y Xu, A Mierop, AJP Theuwissen

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	2011 International Image Sensor Workshop (IISW)
Editors	N Terashini, J Nakamura
Place of Publication	Hokkkaido, Japan
Publisher	Image Sensors
Pages	78-81
Number of pages	4
Publication status	Published - 2011
Event	2011 IISW - Hokkkaido, Japan Duration: 8 Jun 2011 → 11 Jun 2011

Name
Publisher	Image Sensors

Conference	2011 IISW
Period	8/06/11 → 11/06/11

Cite this

@inproceedings{d270770f5e4c44179c8d6de2f81fff4e,

title = "Column-Parallel Circuits with Digital Correlated Multiple Sampling for Low Noise CMOS Imagers",

author = "Y Chen and Y Xu and A Mierop and AJP Theuwissen",

year = "2011",

language = "English",

publisher = "Image Sensors",

pages = "78--81",

editor = "N Terashini and J Nakamura",

booktitle = "2011 International Image Sensor Workshop (IISW)",

note = "2011 IISW ; Conference date: 08-06-2011 Through 11-06-2011",

}

Column-Parallel Circuits with Digital Correlated Multiple Sampling for Low Noise CMOS Imagers. / Chen, Y; Xu, Y; Mierop, A et al.
2011 International Image Sensor Workshop (IISW). ed. / N Terashini; J Nakamura. Hokkkaido, Japan: Image Sensors, 2011. p. 78-81.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Column-Parallel Circuits with Digital Correlated Multiple Sampling for Low Noise CMOS Imagers

AU - Chen, Y

AU - Xu, Y

AU - Mierop, A

AU - Theuwissen, AJP

PY - 2011

Y1 - 2011

M3 - Conference contribution

SP - 78

EP - 81

BT - 2011 International Image Sensor Workshop (IISW)

A2 - Terashini, N

A2 - Nakamura, J

PB - Image Sensors

CY - Hokkkaido, Japan

T2 - 2011 IISW

Y2 - 8 June 2011 through 11 June 2011

ER -