Combined BEM/FEM substrate resistance modeling

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

30 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings 2002 Design automation conference; 39th DNC
Place of Publication	New York
Publisher	ACM
Pages	771-776
Number of pages	6
ISBN (Print)	1-58113-461-4
Publication status	Published - 2002
Event	39th Design automation conference - New York Duration: 10 Jun 2002 → 14 Jun 2002

Name
Publisher	ACM Press

Conference	39th Design automation conference
Period	10/06/02 → 14/06/02

Keywords

@inproceedings{a0a9aee62901415f813e824fadcab691,

title = "Combined BEM/FEM substrate resistance modeling",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, ZX CWTS JFIS < 1.00",

author = "E Schrik and {van der Meijs}, NP",

year = "2002",

language = "Undefined/Unknown",

isbn = "1-58113-461-4",

publisher = "ACM",

pages = "771--776",

booktitle = "Proceedings 2002 Design automation conference; 39th DNC",

address = "United States",

note = "39th Design automation conference ; Conference date: 10-06-2002 Through 14-06-2002",

}

TY - GEN

T1 - Combined BEM/FEM substrate resistance modeling

AU - Schrik, E

AU - van der Meijs, NP

PY - 2002

Y1 - 2002

KW - Elektrotechniek

KW - Techniek

KW - conference contrib. refereed

KW - ZX CWTS JFIS < 1.00

M3 - Conference contribution

SN - 1-58113-461-4

SP - 771

EP - 776

BT - Proceedings 2002 Design automation conference; 39th DNC

PB - ACM

CY - New York

T2 - 39th Design automation conference

Y2 - 10 June 2002 through 14 June 2002

ER -