Combined BEM/FEM vs. 3DFEM substrate resistance modeling

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationProRISC 2004; Proceedings of the program for research on integrated systems and circuits
Place of PublicationUtrecht
PublisherTechnology Foundation STW
Pages435-441
Number of pages7
ISBN (Print)90-73461-43-X
Publication statusPublished - 2004
EventProgram for research on integrated systems and circuits - Utrecht, Veldhoven, Netherlands
Duration: 25 Nov 200427 Nov 2004

Publication series

Name
PublisherTechnology Foundation STW

Conference

ConferenceProgram for research on integrated systems and circuits
CountryNetherlands
CityVeldhoven
Period25/11/0427/11/04

Keywords

  • Vakpubl., Overig wet. > 3 pag

Cite this

Schrik, E., & van der Meijs, NP. (2004). Combined BEM/FEM vs. 3DFEM substrate resistance modeling. In ProRISC 2004; Proceedings of the program for research on integrated systems and circuits (pp. 435-441). Technology Foundation STW.