Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer

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Abstract

The development of Integrated Circuits for the Automotive sector imposes on complex challenges. ISO26262 Functional Safety requirements entail extensive Fault Injection campaigns and complex analysis for the evaluation of deployed Software Tools. This paper proposes a methodology to improve Fault Analysis Tools Confidence Level (TCL) by detecting errors in the classification of faults. By combining the strengths of Automatic Test Pattern Generators (ATPG), Formal Methods and Fault Injection Simulators we are able to automatically generate a Test Environment that enables the validation of the tools and provides supplementary information about the design behavior. Our results showed fault detection rates above 99% including information to improve ISO26262 metrics calculation
Original languageEnglish
Title of host publicationProceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019
EditorsR.S. Bilof
Place of PublicationPiscataway
PublisherIEEE
Pages129-134
Number of pages6
Volume2019-December
ISBN (Electronic)978-1-7281-2695-1
ISBN (Print)978-1-7281-2696-8
DOIs
Publication statusPublished - 2020
Event2019 IEEE 28th Asian Test Symposium (ATS) - Kolkata, India
Duration: 10 Dec 201913 Dec 2019

Publication series

Name2019 IEEE 28TH ASIAN TEST SYMPOSIUM (ATS)
ISSN (Print)1081-7735

Conference

Conference2019 IEEE 28th Asian Test Symposium (ATS)
CountryIndia
CityKolkata
Period10/12/1913/12/19

Keywords

  • ISO26262
  • Fault Injection
  • Formal Methods
  • Simulation
  • Tool Confidence Level
  • Functional Safety
  • Verification
  • ATPG
  • ISO26262 Fault Injection

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  • Cite this

    Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S., & Sauer, C. (2020). Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification. In R. S. Bilof (Ed.), Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019 (Vol. 2019-December, pp. 129-134). [8949396] (2019 IEEE 28TH ASIAN TEST SYMPOSIUM (ATS)). IEEE. https://doi.org/10.1109/ATS47505.2019.00024