Common information model (CIM) extension for asset management in future intelligent grids

G Bajracharya, TL Koltunowicz, D Djairam, JJ Smit

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of the 2010 International Conference on Condition Monitoring and Diagnosis
Editors	s.n.
Place of Publication	Tokyo, Japan
Publisher	IEEE
Pages	882-885
Number of pages	4
Publication status	Published - 2010
Event	2010 International Conference on Condition Monitoring and Diagnosis - Tokyo, Japan Duration: 6 Sept 2010 → 11 Sept 2010

Name
Publisher	IEEJ

Conference	2010 International Conference on Condition Monitoring and Diagnosis
Period	6/09/10 → 11/09/10

Keywords

@inproceedings{61c0ee78747749a2b6c5a167eb6620e4,

title = "Common information model (CIM) extension for asset management in future intelligent grids",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "G Bajracharya and TL Koltunowicz and D Djairam and JJ Smit",

year = "2010",

language = "English",

publisher = "IEEE",

pages = "882--885",

editor = "s.n.",

booktitle = "Proceedings of the 2010 International Conference on Condition Monitoring and Diagnosis",

address = "United States",

note = "2010 International Conference on Condition Monitoring and Diagnosis ; Conference date: 06-09-2010 Through 11-09-2010",

}

Common information model (CIM) extension for asset management in future intelligent grids. / Bajracharya, G; Koltunowicz, TL; Djairam, D et al.
Proceedings of the 2010 International Conference on Condition Monitoring and Diagnosis. ed. / s.n. Tokyo, Japan: IEEE, 2010. p. 882-885.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Common information model (CIM) extension for asset management in future intelligent grids

AU - Bajracharya, G

AU - Koltunowicz, TL

AU - Djairam, D

AU - Smit, JJ

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SP - 882

EP - 885

BT - Proceedings of the 2010 International Conference on Condition Monitoring and Diagnosis

A2 - s.n., null

PB - IEEE

CY - Tokyo, Japan

T2 - 2010 International Conference on Condition Monitoring and Diagnosis

Y2 - 6 September 2010 through 11 September 2010

ER -