Comparative analysis of compact noise model formulations for SiGe-HBTs

F Vitale, R van der Toorn

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings 2013 IEEE Bipolar/BiCMOS circuits and technology
EditorsB Hecht, DYC Lie
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages131-134
Number of pages4
ISBN (Print)978-1-4799-0126-6/13
Publication statusPublished - 2013
Event2013 IEEE BCTM - Piscataway, NJ, USA
Duration: 30 Sep 20133 Oct 2014

Publication series

Name
PublisherIEEE

Conference

Conference2013 IEEE BCTM
Period30/09/133/10/14

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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