Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

H Kukner, F Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, F Catthoor, L van der Perre, R Lauwereins, G Groeseneken

Research output: Contribution to journalArticleScientificpeer-review

37 Citations (Scopus)
Original languageEnglish
Pages (from-to)182-193
Number of pages12
JournalIEEE Transactions on Device and Materials Reliability
Issue number1
Publication statusPublished - 2014

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