Compensation of High-Frequency Disturbances in Scanning Microscopes

P Kruit, VF van Ravesteijn, B Rieger, F Berwald, JHM van der Linden

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

Original language	Undefined/Unknown
Title of host publication	From Scientific Instrument to Industrial Machine Coping with Architectural Stress in Embedded Systems
Editors	R Doornbos, S van Loo
Place of Publication	s.n.
Publisher	Springer
Pages	98-102
Number of pages	112
ISBN (Print)	978-94-007-4146-1
Publication status	Published - 2012

Cite this

@inbook{add1a05ca1644476af9294276cb15000,

title = "Compensation of High-Frequency Disturbances in Scanning Microscopes",

author = "P Kruit and {van Ravesteijn}, VF and B Rieger and F Berwald and {van der Linden}, JHM",

year = "2012",

language = "Undefined/Unknown",

isbn = "978-94-007-4146-1",

pages = "98--102",

editor = "R Doornbos and {van Loo}, S",

booktitle = "From Scientific Instrument to Industrial Machine Coping with Architectural Stress in Embedded Systems",

publisher = "Springer",

}

Compensation of High-Frequency Disturbances in Scanning Microscopes. / Kruit, P; van Ravesteijn, VF; Rieger, B et al.
From Scientific Instrument to Industrial Machine Coping with Architectural Stress in Embedded Systems. ed. / R Doornbos; S van Loo. s.n.: Springer, 2012. p. 98-102.

Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific

TY - CHAP

T1 - Compensation of High-Frequency Disturbances in Scanning Microscopes

AU - Kruit, P

AU - van Ravesteijn, VF

AU - Rieger, B

AU - Berwald, F

AU - van der Linden, JHM

PY - 2012

Y1 - 2012

M3 - Chapter

SN - 978-94-007-4146-1

SP - 98

EP - 102

BT - From Scientific Instrument to Industrial Machine Coping with Architectural Stress in Embedded Systems

A2 - Doornbos, R

A2 - van Loo, S

PB - Springer

CY - s.n.

ER -