Compiler-aided methodology for low overhead on-line testing

G Nazarian, R.M. Seepers, C Strydis, GN Gaydadjiev

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation
EditorsO Silven, H Jeschke
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages219-226
Number of pages8
ISBN (Print)978-1-4799-0103-6
DOIs
Publication statusPublished - 2013
EventIC SAMOS 2013, Samos, Greece - Piscataway, NJ, USA
Duration: 15 Jul 201318 Jul 2013

Publication series

Name
PublisherIEEE

Conference

ConferenceIC SAMOS 2013, Samos, Greece
Period15/07/1318/07/13

Cite this

Nazarian, G., Seepers, R. M., Strydis, C., & Gaydadjiev, GN. (2013). Compiler-aided methodology for low overhead on-line testing. In O. Silven, & H. Jeschke (Eds.), Proceedings - 2013 International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation (pp. 219-226). IEEE Society. https://doi.org/10.1109/SAMOS.2013.6621126