Complementary study of defects in GaN by photo-etching and TEM

JL Weyer, L Macht, FD Tichelaar, HW Zandbergen, PR Hageman, PK Larsen

    Research output: Contribution to journalArticleScientificpeer-review

    15 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)280-284
    Number of pages5
    JournalMaterials Science and Engineering B: Advanced Functional Solid-state Materials
    Volume91
    Publication statusPublished - 2002

    Keywords

    • ZX CWTS JFIS < 1.00

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