Conducted EMI in SiC JFET inverters due to substrate capacitive coupling

X Gong, JA Ferreira

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings - 28th annual IEEE Applied Power Electronics Conference and Exposition (APEC 2013)
    EditorsS Abedinpour
    Place of PublicationPiscataway, NJ, USA
    PublisherIEEE Society
    Pages2479-2486
    Number of pages8
    ISBN (Print)978-1-4673-4354-1
    DOIs
    Publication statusPublished - 2013
    EventAPEC 2013, Long Beach, California - Piscataway, NJ, USA
    Duration: 17 Mar 201321 Mar 2013

    Publication series

    Name
    PublisherIEEE

    Conference

    ConferenceAPEC 2013, Long Beach, California
    Period17/03/1321/03/13

    Cite this

    Gong, X., & Ferreira, JA. (2013). Conducted EMI in SiC JFET inverters due to substrate capacitive coupling. In S. Abedinpour (Ed.), Proceedings - 28th annual IEEE Applied Power Electronics Conference and Exposition (APEC 2013) (pp. 2479-2486). IEEE Society. https://doi.org/10.1109/APEC.2013.6520644