Contactless measurement of in-circuit reflection coefficients

R Hou, M Spirito, BJ Kooij, F van Rijs, LCN de Vreede

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE MTT-S 2012 International Microwave Symposium Digest
EditorsK Wu
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-3
Number of pages3
ISBN (Print)978-1-4673-1087-1
DOIs
Publication statusPublished - 2012
EventIEEE MTT-S 2012, Montreal, Canada - Piscataway, NJ, USA
Duration: 17 Jun 201222 Jun 2012

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE MTT-S 2012, Montreal, Canada
Period17/06/1222/06/12

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