Skip to main navigation Skip to search Skip to main content

Contactless measurement of in-circuit reflection coefficients

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original languageEnglish
Title of host publicationIEEE MTT-S 2012 International Microwave Symposium Digest
EditorsK Wu
Place of PublicationPiscataway, NJ, USA
PublisherIEEE
Pages1-3
Number of pages3
ISBN (Print)978-1-4673-1087-1
DOIs
Publication statusPublished - 2012
EventIEEE MTT-S 2012, Montreal, Canada - Piscataway, NJ, USA
Duration: 17 Jun 2012 → 22 Jun 2012

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE MTT-S 2012, Montreal, Canada
Period17/06/12 → 22/06/12

Bibliographical note

Harvest
Article number: 6259588

Cite this