Continuous monitoring of tip radius during atomic force microscopy imaging

J Fraxedas, F. Perez-Murano, F Gramazio, M Lorenzoni, E Rull Trinidad, U Staufer

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of SPIE - Scanning Microscopies 2015
EditorsMT Postek, DE Newbury, SF Platek, TK Maugel
Place of PublicationBellingham, WA, USA
PublisherSPIE
Pages1-7
Number of pages7
ISBN (Print)9781628418460
DOIs
Publication statusPublished - 2015
EventScanning Microscopies 2015, Monterey, CA, USA - Bellingham, WA, USA
Duration: 29 Sep 20151 Oct 2015

Publication series

Name
PublisherSPIE
NameProceedings of SPIE- International Society for Optical Engineering
Volume9636
ISSN (Print)0277-786X

Conference

ConferenceScanning Microscopies 2015, Monterey, CA, USA
Period29/09/151/10/15

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