Continuous monitoring of tip radius during atomic force microscopy imaging

J Fraxedas; F. Perez-Murano; F Gramazio; M Lorenzoni; E Rull Trinidad; U Staufer

doi:10.1117/12.2196951

Continuous monitoring of tip radius during atomic force microscopy imaging

J Fraxedas, F. Perez-Murano, F Gramazio, M Lorenzoni, E Rull Trinidad, U Staufer

Micro and Nano Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

4 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of SPIE - Scanning Microscopies 2015
Editors	MT Postek, DE Newbury, SF Platek, TK Maugel
Place of Publication	Bellingham, WA, USA
Publisher	SPIE
Pages	1-7
Number of pages	7
ISBN (Print)	9781628418460
DOIs	https://doi.org/10.1117/12.2196951
Publication status	Published - 2015
Event	Scanning Microscopies 2015, Monterey, CA, USA - Bellingham, WA, USA Duration: 29 Sept 2015 → 1 Oct 2015

Publication series

Name
Publisher	SPIE

Name	Proceedings of SPIE- International Society for Optical Engineering
Volume	9636
ISSN (Print)	0277-786X

Conference

Conference	Scanning Microscopies 2015, Monterey, CA, USA
Period	29/09/15 → 1/10/15

Bibliographical note

Invited paper

Access to Document

10.1117/12.2196951

Cite this

Fraxedas, J., Perez-Murano, F., Gramazio, F., Lorenzoni, M., Rull Trinidad, E., & Staufer, U. (2015). Continuous monitoring of tip radius during atomic force microscopy imaging. In MT. Postek, DE. Newbury, SF. Platek, & TK. Maugel (Eds.), Proceedings of SPIE - Scanning Microscopies 2015 (pp. 1-7). (Proceedings of SPIE- International Society for Optical Engineering; Vol. 9636). SPIE. https://doi.org/10.1117/12.2196951

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title = "Continuous monitoring of tip radius during atomic force microscopy imaging",

author = "J Fraxedas and F. Perez-Murano and F Gramazio and M Lorenzoni and {Rull Trinidad}, E and U Staufer",

note = "Invited paper; Scanning Microscopies 2015, Monterey, CA, USA ; Conference date: 29-09-2015 Through 01-10-2015",

year = "2015",

doi = "10.1117/12.2196951",

language = "English",

isbn = "9781628418460",

publisher = "SPIE",

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Fraxedas, J, Perez-Murano, F, Gramazio, F, Lorenzoni, M, Rull Trinidad, E & Staufer, U 2015, Continuous monitoring of tip radius during atomic force microscopy imaging. in MT Postek, DE Newbury, SF Platek & TK Maugel (eds), Proceedings of SPIE - Scanning Microscopies 2015. Proceedings of SPIE- International Society for Optical Engineering, vol. 9636, SPIE, Bellingham, WA, USA, pp. 1-7, Scanning Microscopies 2015, Monterey, CA, USA, 29/09/15. https://doi.org/10.1117/12.2196951

Continuous monitoring of tip radius during atomic force microscopy imaging. / Fraxedas, J; Perez-Murano, F.; Gramazio, F et al.
Proceedings of SPIE - Scanning Microscopies 2015. ed. / MT Postek; DE Newbury; SF Platek; TK Maugel. Bellingham, WA, USA: SPIE, 2015. p. 1-7 (Proceedings of SPIE- International Society for Optical Engineering; Vol. 9636).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Continuous monitoring of tip radius during atomic force microscopy imaging

AU - Fraxedas, J

AU - Perez-Murano, F.

AU - Gramazio, F

AU - Lorenzoni, M

AU - Rull Trinidad, E

AU - Staufer, U

N1 - Invited paper

PY - 2015

Y1 - 2015

U2 - 10.1117/12.2196951

DO - 10.1117/12.2196951

M3 - Conference contribution

SN - 9781628418460

SP - 1

EP - 7

BT - Proceedings of SPIE - Scanning Microscopies 2015

A2 - Postek, MT

A2 - Newbury, DE

A2 - Platek, SF

A2 - Maugel, TK

PB - SPIE

CY - Bellingham, WA, USA

T2 - Scanning Microscopies 2015, Monterey, CA, USA

Y2 - 29 September 2015 through 1 October 2015

ER -

Fraxedas J, Perez-Murano F, Gramazio F, Lorenzoni M, Rull Trinidad E, Staufer U. Continuous monitoring of tip radius during atomic force microscopy imaging. In Postek MT, Newbury DE, Platek SF, Maugel TK, editors, Proceedings of SPIE - Scanning Microscopies 2015. Bellingham, WA, USA: SPIE. 2015. p. 1-7. (Proceedings of SPIE- International Society for Optical Engineering). doi: 10.1117/12.2196951