Engineering
Series Resistance
100%
Nanowire Device
100%
Gate Voltage
85%
Metal Contact
85%
Nanowires
71%
Reanalysis
57%
Processing
57%
Bias Voltage
57%
Enhancement Factor
42%
Data File
42%
Enhancement
42%
Application
28%
Exact Value
28%
Error
28%
Method Section
28%
Characteristics
28%
Superconductor
28%
Magnetic Field
28%
Quantization (Signal Processing)
28%
Measured Data
28%
Voltage
28%
Experimental Observation
14%
Measurement
14%
Calibration
14%
Trenchless Method
14%
Ac Circuit
14%
Quantum Dot
14%
Actual Value
14%
Amplifier
14%
Excitation Frequency
14%
Hybrid
14%
Charge Carrier
14%
Mean Free Path
14%
Scattering
14%
Ohmic Contacts
14%
Large Fraction
14%
Zeros
14%
Semiconductor
14%
INIS
values
100%
majorana spinors
100%
nanowires
100%
devices
100%
corrections
100%
nanotechnology
100%
voltage
80%
data
66%
transport
53%
transparency
46%
metals
46%
geometry
33%
processing
26%
charges
26%
wires
20%
comparative evaluations
20%
magnetic fields
13%
superconductors
13%
applications
13%
range
13%
removal
13%
errors
13%
quantization
13%
gain
6%
quantum dots
6%
units
6%
distance
6%
hybrids
6%
mean free path
6%
calibration
6%
tunneling
6%
scattering
6%
interfaces
6%
excitation
6%
amendments
6%
semiconductor materials
6%
charge carriers
6%
probability
6%
amplifiers
6%
reviews
6%
tables
6%
length
6%
electrodes
6%
Agricultural and Biological Sciences
Publications
100%
Molecular Wire
100%
Nanotechnology
100%
Origanum
100%
Plateau
88%
Gates
66%
Bias
66%
Geometry
55%
Wire
33%
Fields
22%
Paper
22%
Hybrid
11%
Calibration
11%
Measurement
11%
Semiconductors
11%
Quantum Dot
11%
Age
11%
Peers
11%
Probability
11%
Length
11%
Electrode
11%
Material Science
Contact Resistance
100%
Nanowire
100%
Devices
100%
Metal
38%
Wire
16%
Superconducting Material
11%
Paper
11%
Semiconductor Material
5%
Electronic Circuit
5%
Charge Carrier
5%
Electrode
5%
Quantum Dot
5%
Keyphrases
Line Trace
10%
High Plateau
5%
AC Excitation
5%