Correlation between hydroxyl fraction and O/Al atomic ratio as determined from XPS spectra of aluminum oxide layers

J van den Brand, WG Sloof, HA Terryn, JHW de Wit

    Research output: Contribution to journalArticleScientificpeer-review

    140 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)81-88
    Number of pages8
    JournalSurface and Interface Analysis
    Publication statusPublished - 2004


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