Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

V Nadazdy, R Durny, I Thurzo, E Pincik, A Nishida, J Shimizu, M Kumeda, T Shimizu

Research output: Contribution to journalArticleScientificpeer-review

21 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)195211-1-195211-8
JournalPhysical Review B (Condensed Matter and Materials Physics)
Volume66
Issue number19
Publication statusPublished - 2002

Bibliographical note

wet 6

Keywords

  • ZX CWTS 1.00 <= JFIS < 3.00

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