Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

V Nadazdy, R Durny, I Thurzo, E Pincik, A Nishida, J Shimizu, M Kumeda, T Shimizu

Research output: Contribution to journal › Article › Scientific › peer-review

Original language	Undefined/Unknown
Pages (from-to)	195211-1-195211-8
Journal	Physical Review B (Condensed Matter and Materials Physics)
Volume	66
Issue number	19
Publication status	Published - 2002

wet 6

Keywords

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title = "Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon",

keywords = "ZX CWTS 1.00 <= JFIS < 3.00",

author = "V Nadazdy and R Durny and I Thurzo and E Pincik and A Nishida and J Shimizu and M Kumeda and T Shimizu",

note = "wet 6",

year = "2002",

language = "Undefined/Unknown",

volume = "66",

pages = "195211--1--195211--8",

journal = "Physical Review B (Condensed Matter and Materials Physics)",

issn = "1098-0121",

publisher = "American Physical Society",

number = "19",

}

Research output: Contribution to journal › Article › Scientific › peer-review

TY - JOUR

T1 - Correlation between the results of charge deep-level transient spectroscopy and ESR techniques for undoped hydrogenated amorphous silicon

AU - Nadazdy, V

AU - Durny, R

AU - Thurzo, I

AU - Pincik, E

AU - Nishida, A

AU - Shimizu, J

AU - Kumeda, M

AU - Shimizu, T

N1 - wet 6

PY - 2002

Y1 - 2002

KW - ZX CWTS 1.00 <= JFIS < 3.00

M3 - Article

SN - 1098-0121

VL - 66

SP - 195211-1-195211-8

JO - Physical Review B (Condensed Matter and Materials Physics)

JF - Physical Review B (Condensed Matter and Materials Physics)

IS - 19

ER -