Costs and Benefits of Model-Based Diagnosis

J Pietersma, AJC van Gemund

Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientificpeer-review

Original languageUndefined/Unknown
Title of host publicationTangram: Model-based Integration and Testing of Complex High-Tech Systems
EditorsJ. Tretmans
Place of PublicationDen Dolech 2, 5612 AZ Eindhoven, Netherlands
PublisherEmbedded Systems Institute
Number of pages9
ISBN (Print)978-90-78679-02-8
Publication statusPublished - 2007

Bibliographical note



  • Wiskunde en Informatica
  • Techniek
  • technische Wiskunde en Informatica
  • Boekdeel internat.wet

Cite this