Count-regulated OSEM reconstruction

PEB Vaissier, MC Goorden, AB Taylor, FJ Beekman

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publication2012 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Editors Bo Yu
Place of PublicationNew York USA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages3315-3320
Number of pages6
ISBN (Print)978-146732030-6
DOIs
Publication statusPublished - 2012
Event2012 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), Disneyland hotel Anaheim, California USA - New York USA
Duration: 29 Oct 20123 Nov 2012

Publication series

Name
PublisherInstitute of Electrical and Electronics Engineers Inc.

Conference

Conference2012 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), Disneyland hotel Anaheim, California USA
Period29/10/123/11/12

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