Abstract
A reliable estimate of the saturated soil weight from CPT analysis can be useful for various purposes. An often used relation that gives a reasonable first approximation is presented by Robertson & Cabal (2010). In The Netherlands very soft and highly organic soils are omnipresent and these types of soil are absent in the aforementioned relation. In this paper a new relation is proposed that can be used to estimate the saturated soil unit weight for a wider range of soils, from sands to highly organic soils.
| Original language | English |
|---|---|
| Title of host publication | Cone Penetration Testing 2018 |
| Subtitle of host publication | Proceedings of the 4th International Symposium on Cone Penetration Testing (CPT'18), 21-22 June, 2018, Delft, The Netherlands |
| Editors | Michael A. Hicks, Federico Pisano, Joek Peuchen |
| Place of Publication | London |
| Publisher | CRC Press |
| Pages | 389-394 |
| ISBN (Electronic) | 978-0-429-50598-0 |
| ISBN (Print) | 978-1-138-58449-5 |
| Publication status | Published - 21 Jun 2018 |
| Event | 4th International Symposium on Cone Penetration testing - Aula Conference Centre, Delft, Netherlands Duration: 21 Jun 2018 → 22 Jun 2018 Conference number: 4 https://www.kivi.nl/afdelingen/geotechniek/nieuws/artikel/4th-international-symposium-on-cone-penetration-testing |
Conference
| Conference | 4th International Symposium on Cone Penetration testing |
|---|---|
| Abbreviated title | CPT18 |
| Country/Territory | Netherlands |
| City | Delft |
| Period | 21/06/18 → 22/06/18 |
| Other | CPT’18 will focus on the solution of geotechnical challenges using the cone penetration test (CPT), CPT add-on measurements and companion in-situ penetration tools (such as full flow and free fall penetrometers), with particular emphasis on practical experience and application of research findings. As CPTs play a major role in geo-engineering, CPT’18 will bring together the world’s experts who are working to improve the quality and reduce the difficulties involved. The symposium will be attended by academics, researchers, consultants, practitioners, hardware/software suppliers, certifiers and students. It will be a unique opportunity for meeting people and sharing high-level knowledge. |
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