Criticality assessment of GIS components

MAG Al-Suhaily, S Meijer, JJ Smit, P Sibbald, J Kanters

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

5 Citations (Scopus)

Original language	English
Title of host publication	2010 International Conference on High Voltage Engineering of Application
Editors	s.n.
Place of Publication	New Orleans
Publisher	IEEE Society
Pages	626-629
Number of pages	4
ISBN (Print)	978-1-4244-8285-6/10
Publication status	Published - 2010
Event	2010 International Conference on High Voltage Engineering and Application - New Orleans Duration: 11 Oct 2010 → 14 Oct 2010

Name
Publisher	IEEE

Conference	2010 International Conference on High Voltage Engineering and Application
Period	11/10/10 → 14/10/10

Keywords

@inproceedings{87a96b8051a94cde886372dcbbd80d88,

title = "Criticality assessment of GIS components",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "MAG Al-Suhaily and S Meijer and JJ Smit and P Sibbald and J Kanters",

year = "2010",

language = "English",

isbn = "978-1-4244-8285-6/10",

publisher = "IEEE Society",

pages = "626--629",

editor = "s.n.",

booktitle = "2010 International Conference on High Voltage Engineering of Application",

note = "2010 International Conference on High Voltage Engineering and Application ; Conference date: 11-10-2010 Through 14-10-2010",

}

TY - GEN

T1 - Criticality assessment of GIS components

AU - Al-Suhaily, MAG

AU - Meijer, S

AU - Smit, JJ

AU - Sibbald, P

AU - Kanters, J

PY - 2010

Y1 - 2010

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 978-1-4244-8285-6/10

SP - 626

EP - 629

BT - 2010 International Conference on High Voltage Engineering of Application

A2 - s.n., null

PB - IEEE Society

CY - New Orleans

T2 - 2010 International Conference on High Voltage Engineering and Application

Y2 - 11 October 2010 through 14 October 2010

ER -