Abstract
In this study the role of anisotropy on flux penetration in c-axis epitaxial Tl2Ba2CuO6+𝑥 and YBa2Cu3O7−𝑥 films is investigated by magneto-optics. We study thin films of Tl2Ba2CuO6+𝑥 on substrates with vicinal angles of 0° (well-oriented), 0.5°, 2.5°, and 4° and YBa2Cu3O7−𝑥 films as a function of chain-conduction-induced anisotropy. A crossover from fractal to nonfractal flux penetration is observed with increasing anisotropy. Numerical simulations of anisotropic flux motion are compared with experiment.
| Original language | English |
|---|---|
| Pages (from-to) | 12467-12477 |
| Number of pages | 11 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 58 |
| Issue number | 18 |
| DOIs | |
| Publication status | Published - 1998 |
| Externally published | Yes |
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