INIS
electrons
100%
proteins
100%
resolution
100%
tracks
100%
cryogenics
100%
fluorescence
100%
microscopy
100%
lamellae
100%
milling
100%
ion beams
100%
electron beams
100%
thickness
57%
refractive index
35%
tomography
21%
feedback
21%
scaling
21%
transmission electron microscopy
21%
electron microscopy
21%
depth
21%
precision
14%
sample preparation
14%
applications
14%
scanning electron microscopy
14%
layers
14%
microscopes
14%
reliability
14%
biology
14%
yields
14%
apertures
14%
positioning
7%
production
7%
wavelengths
7%
coolers
7%
cross sections
7%
energy
7%
optics
7%
nanostructures
7%
efficiency
7%
maps
7%
values
7%
fabrication
7%
mean free path
7%
calibration
7%
geometry
7%
optical microscopy
7%
implementation
7%
quality control
7%
nonlinear problems
7%
investigations
7%
errors
7%
thin films
7%
reviews
7%
tools
7%
utilities
7%
data
7%
interference
7%
solutions
7%
beams
7%
corrections
7%
ice
7%
experimental data
7%
Engineering
Milling (Machining)
100%
Focused Ion Beam
83%
Thickness
58%
Refractive Index
41%
Refractivity
41%
Region of Interest
33%
High Resolution
33%
Throughput
25%
Application
16%
Numerical Aperture
16%
Scanning Electron Microscope
16%
Scaling
16%
Complexity
16%
Reliability
16%
Fluorescence Imaging
16%
Yield
16%
High Quality
16%
Thin Films
8%
Production
8%
Calibration
8%
Innovation
8%
Error
8%
Complex Process
8%
Structural Detail
8%
Quality Control
8%
Key Parameter
8%
Estimation
8%
Hydrated Sample
8%
Wavelength
8%
Maps
8%
Scaling Factor
8%
Subcellular
8%
Acquired Data
8%
Fabrication
8%
Artifact
8%
Development
8%
Fields
8%
Measurement
8%
Integration
8%
Positioning Stage
8%
Efficiency
8%
Target Region
8%
Mean Free Path
8%
Thickness Measurement
8%
Reflected Light
8%
Success Rate
8%
Cross Section
8%
Energy Engineering
8%
Keyphrases
Ion Beam Microscopy
100%
Pt Layer
20%
Distortion Correction
10%
Transmision
10%
Coincidence Imaging
10%
Cryogenic Cooler
10%
Thin-film Interference
10%
Material Science
Distortion Correction
10%