Crystallographic analysis of thin specimens

VGM Sivel, FD Tichelaar, H Mohdadi, PFA Alkemade, HW Zandbergen

    Research output: Contribution to journalArticleScientificpeer-review

    11 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)115-124
    Number of pages10
    JournalJournal of Microscopy
    Volume218
    Issue number2
    Publication statusPublished - 2005

    Keywords

    • academic journal papers
    • ZX CWTS JFIS < 1.00

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