Crystallographic analysis of thin specimens

VGM Sivel, FD Tichelaar, H Mohdadi, PFA Alkemade, HW Zandbergen

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{782cb73078ee48928c7752f2abc57e4f,

title = "Crystallographic analysis of thin specimens",

keywords = "academic journal papers, ZX CWTS JFIS < 1.00",

author = "VGM Sivel and FD Tichelaar and H Mohdadi and PFA Alkemade and HW Zandbergen",

year = "2005",

language = "Undefined/Unknown",

volume = "218",

pages = "115--124",

journal = "Journal of Microscopy",

issn = "0022-2720",

publisher = "Blackwell",

number = "2",

}