Curvature estimation for overlapping curved patterns using orientation space

M van Ginkel, PW Verbeek, LJ van Vliet

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProc. ASCI'98, 4th Annual Conference of the Advanced School for Computing and Imaging
    EditorsBM ter Haar Romeny, DHJ Epema, JFM Tonino, AA Wolters
    Number of pages6
    Publication statusPublished - 1998

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