Curvature estimation for overlapping curved patterns using orientation space

M van Ginkel, PW Verbeek, LJ van Vliet

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProc. ASCI'98, 4th Annual Conference of the Advanced School for Computing and Imaging
    EditorsBM ter Haar Romeny, DHJ Epema, JFM Tonino, AA Wolters
    Pages173-178
    Number of pages6
    Publication statusPublished - 1998

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