Danger! High voltage! The application of handheld X-ray fluorescence (HH-XRF) to experimental glass: pitfalls and potentials

R Scott, D Braekmans, D Brems, P Degryse

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 39th International Symposium for Archaeometry
    EditorsRB Scott, D Braekmans, M Carremans, P Degryse
    Place of PublicationLeuven, Belgium
    PublisherLeuven University Press
    Pages268-273
    Number of pages6
    ISBN (Print)978-94-6165-120-4
    Publication statusPublished - 2014
    EventISA 2012, Leuven, Belgium - Leuven, Belgium
    Duration: 28 May 20121 Jun 2012

    Publication series

    Name
    PublisherLeuven University Press

    Conference

    ConferenceISA 2012, Leuven, Belgium
    Period28/05/121/06/12

    Cite this

    Scott, R., Braekmans, D., Brems, D., & Degryse, P. (2014). Danger! High voltage! The application of handheld X-ray fluorescence (HH-XRF) to experimental glass: pitfalls and potentials. In RB. Scott, D. Braekmans, M. Carremans, & P. Degryse (Eds.), Proceedings of the 39th International Symposium for Archaeometry (pp. 268-273). Leuven University Press.