Abstract
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides a simple reasoning for the relationship between tip-sample interactions and operation parameters (amplitude and frequency). The proposed formulation, which attributes the amplitude reduction to an interference between the tip-sample and dither force, only deals with the linear part of the system; however, it fully agrees with experimental results and numerical solutions of the full nonlinear model of TM-AFM.
Original language | English |
---|---|
Article number | 163104 |
Number of pages | 6 |
Journal | Applied Physics Letters |
Volume | 112 |
Issue number | 16 |
DOIs | |
Publication status | Published - 2018 |
Keywords
- Continuum mechanics
- Intermolecular forces
- Newtonian mechanics
- Atomic force microscopy
- Fourier analysis
- Nanopatterning
- Nonlinear dynamics