Deconvolution methods for structured illumination microscopy

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    38 Citations (Scopus)

    Abstract

    We compare two recently developed multiple-frame deconvolution approaches for the reconstruction of structured illumination microscopy (SIM) data: the pattern-illuminated Fourier ptychography algorithm (piFP) and the joint Richardson-Lucy deconvolution (jRL). The quality of the images reconstructed by these methods is compared in terms of the achieved resolution improvement, noise enhancement, and inherent artifacts. Furthermore, we study the issue of object-dependent resolution improvement by considering the modulation transfer functions derived from different types of objects. The performance of the considered methods is tested in experiments and benchmarked with a commercial SIM microscope. We find that the piFP method resolves periodic and isolated structures equally well, whereas the jRL method provides significantly higher resolution for isolated objects compared to periodic ones. Images reconstructed by the piFP and jRL algorithms are comparable to the images reconstructed using the generalized Wiener filter applied in most commercial SIM microscopes. An advantage of the discussed algorithms is that they allow the reconstruction of SIM images acquired under different types of illumination, such as multi-spot or random illumination.

    Original languageEnglish
    Pages (from-to)B12-B20
    JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
    Volume33
    Issue number7
    DOIs
    Publication statusPublished - 1 Jul 2016

    Keywords

    • Fluorescence microscopy
    • Deconvolution
    • Inverse problems

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