Defect oriented testing of the strap problem under process variations in DRAMs

Z Al-Ars, S Hamdioui, AJ van de Goor, G Mueller

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

11 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProc. International Test Conference 2008
Editors s.n.
Place of PublicationWashington DC
PublisherITC
Pages1-10
Number of pages10
ISBN (Print)978-1-4244-2403-0
Publication statusPublished - 2008
EventITC 2008 - Washington DC
Duration: 28 Oct 200830 Oct 2008

Publication series

Name
PublisherITC

Conference

ConferenceITC 2008
Period28/10/0830/10/08

Keywords

  • Elektrotechniek
  • Techniek
  • conference contrib. refereed
  • Conf.proc. > 3 pag

Cite this