Defects-induced thermal instability in YBO films in microwave fields

V Pan, C.G. Tretiatchenko, VS Flis, VA Komashko, EA Pashitskii, AN Ivanyuta, GA Melkov, HW Zandbergen, V Svetchnikov

    Research output: Book/ReportReportScientific

    Original languageUndefined/Unknown
    Place of PublicationHiroshima
    PublisherHiroshima
    Number of pages1
    Publication statusPublished - 2002

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    PublisherHiroshima

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