Defining SRAM resistive defects and their simulation stimuli

AJ van de Goor Ph D, JE Simonse

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationEighth Asian Test Symposium: proceedings
Place of PublicationLos Alamitos
PublisherIEEE
Pages33-40
Number of pages8
ISBN (Print)0-7695-0315-2
Publication statusPublished - 1999
EventATS '99, Shanghai - Los Alamitos
Duration: 16 Nov 199918 Nov 1999

Publication series

Name
PublisherIEEE Computer Society

Conference

ConferenceATS '99, Shanghai
Period16/11/9918/11/99

Keywords

  • ZX Int.klas.verslagjaar < 2002

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