Degradation of CMOS image sensors in deep-submicron technology due to gamma-radiation

Rao padmakumar, X Wang, AJP Theuwissen

Research output: Contribution to journalArticleScientific

48 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)1407-1413
Number of pages7
JournalSolid-State Electronics
Volume52
Publication statusPublished - 2008

Keywords

  • professional journal papers
  • CWTS JFIS < 0.75

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