Degradation of CMOS image sensors in deep-submicron technology due to gamma-radiation

Rao padmakumar, X Wang, AJP Theuwissen

Research output: Contribution to journal › Article › Scientific

Keywords

@article{fbb4f8d6a8374d92b4c4e34c6ac36f43,

title = "Degradation of CMOS image sensors in deep-submicron technology due to gamma-radiation",

keywords = "professional journal papers, CWTS JFIS < 0.75",

author = "Rao padmakumar and X Wang and AJP Theuwissen",

year = "2008",

language = "Undefined/Unknown",

volume = "52",

pages = "1407--1413",

journal = "Solid-State Electronics",

issn = "0038-1101",

publisher = "Elsevier",

}