@inproceedings{07bc86e3d9bd4f219856bf7973db62bb,
title = "Degradation of Diode Junction Characteristics due to Residual Defects Caused by Laser-Annealed Implantations Studied by Bipolar Test Structures",
keywords = "conference contrib. refereed, Conf.proc. > 3 pag",
author = "V Gonda and TLM Scholtes and LK Nanver",
year = "2006",
language = "Undefined/Unknown",
isbn = "90-73461-44-8",
publisher = "s.l.",
pages = "423--426",
editor = "s.n.",
booktitle = "Proceedings of 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors",
note = "9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors ; Conference date: 23-11-2006 Through 24-11-2006",
}