Degradation of silicone-based sealing materials used in microelectronics

Maryam Yazdan Mehr*, Pejman Hajipour, H. van Zeijl, W.D. van Driel, Thierry Cooremans, Francois De Buyl, G.Q. Zhang

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

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Abstract

Adhesive bonding is a key joining technology in many industrial applications, including automotive, aerospace industries, biomedical devices, and microelectronic components. Adhesive bonding is gaining more and more attention due to the increasing demand for joining similar or dissimilar components, mostly within the framework of designing lightweight structures. Silicone sealant is widely used in engineering application due to its thermal stability, excellent energy absorption, and good damping characteristics. In those applications, sealant usually exposed to various environment stress, such as, high temperature, mechanical stress, humidity, light radiation, and chemical attack. Long-term stability and durability of sealant is crucial to the performance of the associated application. The main degrading factors for silicone in microelectronic applications are temperature, humidity, alkali, and mechanical loading. The focus in the present paper is to understand different failure mechanisms in silicone sealants and adhesives and to study how different environmental, mechanical, and service-related stresses attribute to the kinetics and extent of degradation in silicone sealants and adhesives. The impact of different failure mechanisms on the lifetime and reliability of microelectronic devices will be methodically investigated.
Original languageEnglish
Title of host publicationProceedings of the 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
PublisherIEEE
Pages1-4
Number of pages4
ISBN (Electronic)979-8-3503-4597-1
ISBN (Print)979-8-3503-4598-8
DOIs
Publication statusPublished - 2023
Event2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Graz, Austria
Duration: 16 Apr 202319 Apr 2023
Conference number: 24th

Publication series

Name2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2023

Conference

Conference2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
Country/TerritoryAustria
CityGraz
Period16/04/2319/04/23

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

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