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Degradation of silicone-based sealing materials used in microelectronics
Maryam Yazdan Mehr*, Pejman Hajipour, H. van Zeijl, W.D. van Driel, Thierry Cooremans, Francois De Buyl, G.Q. Zhang
*Corresponding author for this work
Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review
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