Degradation study of a reversible solid oxide cell (rSOC) short stack using distribution of relaxation times (DRT) analysis

Suhas Niggehalli Sampathkumar*, Philippe Aubin, Karine Couturier, Xiufu Sun, Bhaskar Reddy Sudireddy, Stefan Diethelm, Mar Pérez-Fortes, Jan van Herle

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

20 Citations (Scopus)
105 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Degradation study of a reversible solid oxide cell (rSOC) short stack using distribution of relaxation times (DRT) analysis'. Together they form a unique fingerprint.

INIS

Engineering

Material Science

Chemical Engineering