Dependability of Future Edge-AI Processors: Pandora’s Box

Manil Dev  Gomony; Anteneh Gebregiorgis; Moritz Fieback; Marc Geilen; Sander Stuijk; Jan  Richter-Brockmann; Rajendra Bishnoi; Mottaqiallah Taouil; Said Hamdioui; null More Authors

doi:10.1109/ETS56758.2023.10174180

Dependability of Future Edge-AI Processors: Pandora’s Box

Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui, More Authors

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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Abstract

This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these emerging devices inherently suffering from many non-idealities are calling for new solutions in order to ensure accurate and reliable edge computing. Moreover, the paper also covers the security aspects for future edge processors and shows the challenges and the future directions.

Original language	English
Title of host publication	Proceedings of the 2023 IEEE European Test Symposium (ETS)
Publisher	IEEE
Number of pages	6
ISBN (Electronic)	979-8-3503-3634-4
ISBN (Print)	979-8-3503-3635-1
DOIs	https://doi.org/10.1109/ETS56758.2023.10174180
Publication status	Published - 2023
Event	2023 IEEE European Test Symposium (ETS) - Venezia, Italy Duration: 22 May 2023 → 26 May 2023

Publication series

Name	Proceedings of the European Test Workshop
Volume	2023-May
ISSN (Print)	1530-1877
ISSN (Electronic)	1558-1780

Conference

Conference	2023 IEEE European Test Symposium (ETS)
Country/Territory	Italy
City	Venezia
Period	22/05/23 → 26/05/23

Bibliographical note

Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

ULP
dynamic DL
edge-AI
SoC
memristor
approximate computing
DSE
compiler stack

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10.1109/ETS56758.2023.10174180

Dependability_of_Future_Edge-AI_Processors_Pandoras_BoxFinal published version, 1.42 MB

Cite this

Gomony, M. D., Gebregiorgis, A., Fieback, M., Geilen, M., Stuijk, S., Richter-Brockmann, J., Bishnoi, R., Taouil, M., Hamdioui, S., & More Authors (2023). Dependability of Future Edge-AI Processors: Pandora’s Box. In Proceedings of the 2023 IEEE European Test Symposium (ETS) (Proceedings of the European Test Workshop; Vol. 2023-May). IEEE. https://doi.org/10.1109/ETS56758.2023.10174180

@inproceedings{d1579060d88043fbbd7df78f42d28cec,

title = "Dependability of Future Edge-AI Processors: Pandora{\textquoteright}s Box",

abstract = "This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these emerging devices inherently suffering from many non-idealities are calling for new solutions in order to ensure accurate and reliable edge computing. Moreover, the paper also covers the security aspects for future edge processors and shows the challenges and the future directions.",

keywords = "ULP, dynamic DL, edge-AI, SoC, memristor, approximate computing, DSE, compiler stack",

author = "Gomony, {Manil Dev} and Anteneh Gebregiorgis and Moritz Fieback and Marc Geilen and Sander Stuijk and Jan Richter-Brockmann and Rajendra Bishnoi and Mottaqiallah Taouil and Said Hamdioui and {More Authors}",

note = "Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.; 2023 IEEE European Test Symposium (ETS) ; Conference date: 22-05-2023 Through 26-05-2023",

year = "2023",

doi = "10.1109/ETS56758.2023.10174180",

language = "English",

isbn = "979-8-3503-3635-1",

series = "Proceedings of the European Test Workshop",

publisher = "IEEE",

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}

Gomony, MD, Gebregiorgis, A , Fieback, M, Geilen, M, Stuijk, S, Richter-Brockmann, J, Bishnoi, R , Taouil, M , Hamdioui, S & More Authors 2023, Dependability of Future Edge-AI Processors: Pandora’s Box. in Proceedings of the 2023 IEEE European Test Symposium (ETS). Proceedings of the European Test Workshop, vol. 2023-May, IEEE, 2023 IEEE European Test Symposium (ETS), Venezia, Italy, 22/05/23. https://doi.org/10.1109/ETS56758.2023.10174180

Dependability of Future Edge-AI Processors: Pandora’s Box. / Gomony, Manil Dev; Gebregiorgis, Anteneh ; Fieback, Moritz et al.
Proceedings of the 2023 IEEE European Test Symposium (ETS). IEEE, 2023. (Proceedings of the European Test Workshop; Vol. 2023-May).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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AU - Geilen, Marc

AU - Stuijk, Sander

AU - Richter-Brockmann, Jan

AU - Bishnoi, Rajendra

AU - Taouil, Mottaqiallah

AU - Hamdioui, Said

AU - More Authors, null

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AB - This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these emerging devices inherently suffering from many non-idealities are calling for new solutions in order to ensure accurate and reliable edge computing. Moreover, the paper also covers the security aspects for future edge processors and shows the challenges and the future directions.

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KW - edge-AI

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KW - memristor

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BT - Proceedings of the 2023 IEEE European Test Symposium (ETS)

PB - IEEE

Y2 - 22 May 2023 through 26 May 2023

ER -

Dependability of Future Edge-AI Processors: Pandora’s Box

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Keywords

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