Abstract
This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these emerging devices inherently suffering from many non-idealities are calling for new solutions in order to ensure accurate and reliable edge computing. Moreover, the paper also covers the security aspects for future edge processors and shows the challenges and the future directions.
Original language | English |
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Title of host publication | Proceedings of the 2023 IEEE European Test Symposium (ETS) |
Publisher | IEEE |
Number of pages | 6 |
ISBN (Electronic) | 979-8-3503-3634-4 |
ISBN (Print) | 979-8-3503-3635-1 |
DOIs | |
Publication status | Published - 2023 |
Event | 2023 IEEE European Test Symposium (ETS) - Venezia, Italy Duration: 22 May 2023 → 26 May 2023 |
Publication series
Name | Proceedings of the European Test Workshop |
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Volume | 2023-May |
ISSN (Print) | 1530-1877 |
ISSN (Electronic) | 1558-1780 |
Conference
Conference | 2023 IEEE European Test Symposium (ETS) |
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Country/Territory | Italy |
City | Venezia |
Period | 22/05/23 → 26/05/23 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository 'You share, we take care!' - Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.
Keywords
- ULP
- dynamic DL
- edge-AI
- SoC
- memristor
- approximate computing
- DSE
- compiler stack