Dependence of single-crystalline Si TFT characteristics on the channel position inside a location-controlled grain

V Rana, R Ishihara, Y Hiroshima, D Abe, S Inoue, T Shimoda, JW Metselaar, CIM Beenakker

Research output: Contribution to journalArticleScientificpeer-review

42 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)2622-2628
Number of pages7
JournalIEEE Transactions on Electron Devices
Volume52
Issue number12
DOIs
Publication statusPublished - 2005

Keywords

  • academic journal papers
  • ZX CWTS 1.00 <= JFIS < 3.00

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