Depth-profiling of subsurface regions, interfaces and thin films

A van Veen, H Schut, PE Mijnarends

    Research output: Chapter in Book/Conference proceedings/Edited volumeChapterScientificpeer-review

    Original languageUndefined/Unknown
    Title of host publicationPositron beams and their applications
    Editors PG Coleman
    Place of PublicationSingapore
    PublisherWorld Scientific
    Publication statusPublished - 2000


    • ZX Int.klas.verslagjaar < 2002

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